DESIGN FOR TEST (DFT)
Crafting designs for zero-defect manufacturing.
Offering top-quality and highly-efficient DFT process and methodology with in-depth experience in all EDA tools to enable a design with the highest coverage and lowest test times.
Do it right with Ignitarium.
Our Offerings
DFT architecture definition
RTL modification for DFT-friendly design
Low power and topographical synthesis
Hierarchical DFT implementation and full-chip porting
DFT SDC generation for STA
DFT (JTAG, SCAN, MBIST) insertion and verification
ATPG pattern generation and Timing simulation
Test coverage analysis and improvement
Post-silicon pattern delivery and pattern debug
DFT DRC checks and fixes
DFT Stages
1 – Architecture and Planning
IO scan channel, pin usage and block chains allocation planning
BSCAN-JTAG, MBIST-JTAG, IP_JTAG sharing
SCAN flow – Hierarchical / compression, OCC placement
3 rd party IP integration
Block level and Top-level signal planning
Low power planning
2 – DFT Implementation
SCAN,OCC,COMP insertion
MBIST, Repair insertion
JTAG & BSCAN insertion
Logic Equivalence check
Block to Top integration
DFT DRC cleanup and suggestion for DRC fix.
DFT Lint cleanup
3 – PATTERN Generation & Validation
JTAG/BSCAN/SCAN/MBIST pattern generation and validation at block level and chip-top level.
Gate level simulation of Patterns – both zero delay and with timing
Testcase analysis and Improvement
Pattern delivery
Pattern debug
4 – DFT Constraints and STA Signoff
Scan shift mode
Scan capture mode
Scan TF mode
Mbist mode
Jtag mode
Bscan mode
Architecture and Planning
IO scan channel, pin usage and block chains allocation planning
BSCAN-JTAG, MBIST-JTAG, IP_JTAG sharing
SCAN flow – Hierarchical / compression, OCC placement
3rd party IP integration
Block level and Top-level signal planning
Low power planning
DFT Implementation
SCAN, OCC, COMP insertion
MBIST, Repair insertion
JTAG & BSCAN insertion
Logic Equivalence check
Block to Top integration
DFT DRC cleanup and suggestion for DRC fix
DFT Lint cleanup
PATTERN Generation & Validation
JTAG/BSCAN/SCAN/MBIST pattern generation and validation at block level and chip-top level
Gate level simulation of Patterns – both zero delay and with timing
Testcase analysis and Improvement
Pattern delivery
Pattern debug
DFT Constraints and STA Signoff
Scan shift mode
Scan capture mode
Scan TF mode
Mbist mode
Jtag mode
Bscan mode
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